▲ (From left) Professor Woo Young Choi and Ph.D. student Jin Ho Chang

 
▲ Samsung Electronics Industry-Academia Cooperation Paper Awards

Jin Ho Chang, a Ph.D. student in the Three-Dimensional Integration & Device Lab (TIDL) led by Professor Woo Young Choi, received the Excellence Award at the Samsung Electronics Industry-Academia Cooperation Paper Awards, hosted by Samsung Electronics on August 19.

The award-winning paper, titled “Large-Scale and Highly Reliable Hopfield Neural Networks Using Vertical NAND Flash Memory for In-Memory Associative Computing,” presents a large-scale, highly reliable Hopfield neural network based on vertical NAND flash memory and demonstrates its application to in-memory associative computing.

The research was also published as the front cover article in the April 2026 issue of Advanced Intelligent Systems.

Source: https://ece.snu.ac.kr/ece/news?md=v&bbsidx=58000

Translated by: Changhoon Kang, English Editor of the Department of Electrical and Computer Engineering, changhoon27@snu.ac.kr